In this study, the surface roughness is calculated using SEM images on a large scale with aid of AFM image for SnO2 thin surface fabricated by depositing onto glass substrates at room temperature using thermal evaporation technique, where different thicknesses (450, 525 and 600 nm) were investigated. The SEM image captured with different zooming scales (1-50 µm). The surface roughness parameters of the thin films are measured using AFM and then compared with the calculated using SEM images for different scales which proved the validity of this approach to calculate the roughness parameter using the SEM images. Beside that the heights contrast parameter is calculated using the SEM images and which shows the homogeneity of the surface of the samples
تاريخ النشر
26/01/2019
الناشر
elsevier
رقم المجلد
157
رقم العدد
الصفحات
84-89
الكلمات المفتاحية
Surface Roughness, SEM Image, AFM Image, Image Processing
حنان كاظم حسون | hanan kadhem hassun | 3736