عنوان المقالة: ANNEALING TIME EFFECT ON NANOSTRUCTURED n-ZnO/p-Si HETEROJUNCTION PHOTODETECTOR PERFORMANCE
حسام رفعت عبد | Husam Rifaat Abed | 2800
نوع النشر
مجلة علمية
المؤلفون بالعربي
المؤلفون بالإنجليزي
NADIR. F. HABUBI, RAID. A. ISMAIL, WALID K. HAMOUDI and HASSAM. R. ABID
الملخص الانجليزي
In this work, n-ZnO/p-Si heterojunction photodetectors were prepared by drop casting of ZnO nanoparticles (NPs) on single crystal p-type silicon substrates, followed by (15–60) min; stepannealing at 600C. Structural, electrical, and optical properties of the ZnO NPs ¯lms deposited on quartz substrates were studied as a function of annealing time. X-ray di®raction studies showed a polycrystalline, hexagonal wurtizte nanostructured ZnO with preferential orientation along the (100) plane. Atomic force microscopy measurements showed an average ZnO grain size within the range of 75.9nm–99.9nm with a corresponding root mean square (RMS) surface roughness between 0.51nm–2.16 nm. Dark and under illumination current–voltage (I–V) characteristics of the n-ZnO/ p-Si heterojunction photodetectors showed an improving recti¯cation ratio and a decreasing saturation current at longer annealing time with an ideality factor of 3 obtained at 60 min annealing time. Capacitance–voltage (C–V) characteristics of heterojunctions were investigated in order to estimate the built-in-voltage and junction type. The photodetectors, fabricated at optimum annealing time, exhibited good linearity characteristics. Maximum sensitivity was obtained when ZnO/Si heterojunctions were annealed at 60 min. Two peaks of response, located at 650nm and 850 nm, were observed with sensitivities of 0.12–0.19A/W and 0.18–0.39 A/W, respectively. Detectivity of the photodetectors as function of annealing time was estimated.
تاريخ النشر
25/02/2015
الناشر
World Scientific Publishing Company
رقم المجلد
22
رقم العدد
1
رابط DOI
http://dx.doi.org/10.1142/S0218625X15500274
الكلمات المفتاحية
ZnO nanoparticles; photodetectors; drop casting; annealing
رجوع