عنوان المقالة: Assessing combinatorial interaction strategy for reverse engineering of combinational circuits Assessing combinatorial interaction strategy for reverse engineering of combinational circuits
ا.د. محمد عصام يونس | Mohammed I. Younis | 14107
- نوع النشر
- مؤتمر علمي
- المؤلفون بالعربي
- Mohammed I. Younis ; Kamal Z. Zamli
- المؤلفون بالإنجليزي
- Mohammed I. Younis ; Kamal Z. Zamli
- الملخص العربي
- T-way test data generators play an immensely important role for both hardware and software configuration testing. Earlier work concludes that t-way test data generator can achieve 100% coverage without having to regard for more than 6 way interactions. In this paper, we investigate whether or not such a conclusion can be applicable for reverse engineering of combinational circuits. In this case, we reverse engineer a faulty commercial eight segment display controller using our t-way test data generator in order to redesign the replacement unit. We believe that our application of t-way generators for circuit identification is novel. The results demonstrate the need of more than 6 parameter interactions as well as suggest the effectiveness of cumulative test data for reverse engineering applications.
- الملخص الانجليزي
- T-way test data generators play an immensely important role for both hardware and software configuration testing. Earlier work concludes that t-way test data generator can achieve 100% coverage without having to regard for more than 6 way interactions. In this paper, we investigate whether or not such a conclusion can be applicable for reverse engineering of combinational circuits. In this case, we reverse engineer a faulty commercial eight segment display controller using our t-way test data generator in order to redesign the replacement unit. We believe that our application of t-way generators for circuit identification is novel. The results demonstrate the need of more than 6 parameter interactions as well as suggest the effectiveness of cumulative test data for reverse engineering applications.
- تاريخ النشر
- 18/12/2009
- الناشر
- 2009 IEEE Symposium on Industrial Electronics & Applications
- رقم المجلد
- رقم العدد
- رابط DOI
- 10.1109/ISIEA.2009.5356419
- رابط الملف
- تحميل (491 مرات التحميل)
- رابط خارجي
- https://ieeexplore.ieee.org/document/5356419/
- الكلمات المفتاحية
- Combinational Circuits , Test Data Generation , T-Way Testing , Combinatorial Interaction , Configuration Testing , Multi-Way Testing