Hatem Taha, Zhong-Tao Jiang, Chun-Yang Yin, David J. Henry, Xiaoli Zhao, Geoffrey Trotter, and Amun Amri
الملخص الانجليزي
Single-walled carbon nanotubes (SWCNTs)
incorporated in indium tin oxide (ITO) were developed to
fabricate transparent conductive thin films via a sol−gel spin
coating technique. The fabricated thin films were annealed at
350 °C. The effects of incorporating SWCNTs and varying
film thickness on crystal structure were systematically
investigated by X-ray diffraction (XRD), Raman shift, surface
elemental compositions, surface topography and roughness,
optoelectronic characteristics, and mechanical properties. XRD
results confirmed the body-centered cubic structure of indium
oxide polycrystalline phase, indicating that the structural
properties of the ITO films were not significantly altered by
incorporating CNTs. The presence of CNTs in the ITO
matrix was confirmed by analyses of Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and energy dispersive X-ray
spectroscopy (EDX). FESEM images revealed the formation of SWCNTs/ITO nanoparticles, and the average crystallite size
increased along with increasing film thickness. Electrical characteristics also improved as the film thickness increased. The lowest
electrical resistivity (4.6 × 10−4 Ω cm), as well as the highest carrier concentration (3.3 × 1020 cm−3) and carrier mobility (41
cm2/V s) were achieved from the 320 nm thick film. However, the optical transparency decreased from 91 to 87.5% as the film
thickness increased from 150 to 320 nm. The hardness and Young’s modulus of the prepared samples improved, with the
increase of SWCNTs doping level, and achieved the maximum values of 28 and 306 GPa, respectively.
تاريخ النشر
11/01/2018
الناشر
The Journal of Physical Chemistry C/ِACS Publications
رقم المجلد
رقم العدد
ISSN/ISBN
1932-7447
رابط DOI
DOI: 10.1021/acs.jpcc.7b10977
الصفحات
3014−3027
الكلمات المفتاحية
TCO, Optoelectronic properties, Mechanical and chemical ponding ststes characterstics, CNTs
حاتم عبدالرزاق طه | Hatem Taha | 3228