In this study, (Sn1-xVxO2) thin films, where (x = 0, 4, 6 and 8) % have been deposited on glass substrates by chemical spray pyrolysis technique (CSP) at substrate temperature of (400 ºC) and thickness of about 400 ± 10 nm. The structural properties and morphology of these films have been studied using XRD and AFM respectively. XRD analyses showed that these films are polycrystalline in nature with tetragonal Rutile structure with preferred orientation of (110). Doping with Vanadium causes decrease in the grain size and increase in dislocation density, micro strain, and interplanar spacing.
تاريخ النشر
01/09/2016
الناشر
Journal of Chemical, Biological and Physical Sciences
نبيل علي بكر | Nabeel A. Bakr | 5236