عنوان المقالة:دراسة تاثير التلدين على الخواص التركيبية والبصرية لاغشية ZnTe المحضرة بتقنية التبخير الحراري بالفراغ Study of the Influence of Annealing Temperature on the Structural and Optical Properties of ZnTe Prepared by Vacuum Thermal Evaporation Technique
The ZnTe alloy was prepared as deposited thin films on the glass substrates at a
thickness of 400±20 nm using vacuum evaporation technique at pressure (1 × 10-5)
mbar and room temperature. Then the thin films under vacuum (2 × 10-3 mbar) were
annealing at (RT,100 and 300) °C for one hour. The structural properties were studied
by using X-ray diffraction and AFM, the results show that the thin films had
approached the single crystalline in the direction (111) as preferred orientation of the
structure zinc-blende for cubic type, with small peaks of tellurium (Te) element for all
prepared thin films. The calculated crystallite size (Cs) decreased with the increase in
the annealing temperature, from (25) nm before the annealing to (21) nm after the
annealing. The images of atomic force microscopy of all thin films appeared a
homogenous structure and high smoothness through roughness values that increased
slightly from (1.4) nm to (3.4) nm. The optical properties of the ZnTe at (RT,100 and
300) °C were studied transmittance and absorbance spectrum as a function of the
wavelength. The energy gap was found about (2.4) eV for the thin films before the
annealing and increased slightly to (2.5) eV after annealing at 300 °C
الملخص الانجليزي
The ZnTe alloy was prepared as deposited thin films on the glass substrates at a
thickness of 400±20 nm using vacuum evaporation technique at pressure (1 × 10-5)
mbar and room temperature. Then the thin films under vacuum (2 × 10-3 mbar) were
annealing at (RT,100 and 300) °C for one hour. The structural properties were studied
by using X-ray diffraction and AFM, the results show that the thin films had
approached the single crystalline in the direction (111) as preferred orientation of the
structure zinc-blende for cubic type, with small peaks of tellurium (Te) element for all
prepared thin films. The calculated crystallite size (Cs) decreased with the increase in
the annealing temperature, from (25) nm before the annealing to (21) nm after the
annealing. The images of atomic force microscopy of all thin films appeared a
homogenous structure and high smoothness through roughness values that increased
slightly from (1.4) nm to (3.4) nm. The optical properties of the ZnTe at (RT,100 and
300) °C were studied transmittance and absorbance spectrum as a function of the
wavelength. The energy gap was found about (2.4) eV for the thin films before the
annealing and increased slightly to (2.5) eV after annealing at 300 °C
د.سرمد مهدي علي | Dr. Sarmad Mahdi Ali | 1216