The structural properties of ternary chalcopyrite AgAlSe2 compound alloys and thin
films that prepared by the thermal evaporation method at room temperature on glass substrate
with a deposition rate (5±0.1) nm s-1 for different values of thickness (250,500 and 750±20)
nm, have been studied, using X-ray diffraction technology. As well as, the optical properties
of the prepared films have been investigated. The structural investigated shows that the alloy
has polycrystalline structure of tetragonal type with preferential orientation (112), while the
films have amorphous structure. Optical measurement shows that AgAlSe2 films have high
absorption in the range of wavelength (350-700 nm). The optical energy gap for allowed
direct transition were evaluated, which decreases with film thickness increasing, i.e. it
decreases from 2.5 eV to 2.2 eV when thickness varies from 250±20 nm to 750±20 nm.
تاريخ النشر
15/12/2016
الناشر
Ibn Al-Haitham J. for Pure & Appl. Sci
رقم المجلد
29
رقم العدد
2
الصفحات
41-51
الكلمات المفتاحية
AgAlSe2, thin films, energy gap, structure and optical properties.
بشرى هاشم حسين | Bushra H.Hussein | 1321