Fullerene's (C60) thin films of thickness 200 ± 10 nm are coated on soda lime glass substrates using thermal evaporation technique at substrate temperatures of 300 and 400 ºK in base pressure of 10 -5 mbar. The aims of this work are to study the influences of the substrate temperature on the morphological and structural properties of C60 thin films. The analysis of X-ray diffraction patterns (XRD) for both (C60) thin films, which were deposited at different substrate temperatures possesses an amorphous structure. The grain size increased from 13 nm for films deposited at 300º K to 22.5 nm for the films deposited at 400ºK. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) demonstrated that the C60 surface roughness is decreasing as substrate temperature increased.
تاريخ النشر
07/03/2016
الناشر
Proceedings of the 6th International Conference on Nanostructures (ICNS6) 7-10 March 2016, Kish Island, Iran