Abstract: In this study, SnS thin films were deposited onto glass substrate by thermal evaporation technique at 300K temperature. The SnS films have been prepared with different thicknesses (100,200 &300) nm. The crystallographic analysis, film thickness, electrical conductivity, carrier concentration, and carrier mobility were characterized. Measurements showed that depending on film thickness. The D.C. conductivity increased with increase in film thickness from 3.720x10-5 (Ω.cm)-1 for 100 nm thickness to 9.442x10-4 (Ω.cm)-1for 300 nm thicknesses, and the behavior of activation energies, hall mobility, and carrier concentration were also studied.
Publication Date
5/15/2015
Publisher
JCBPS; Section C; Journal of Chemical, Biological and Physical Sciences
Volume No
5
Issue No
3
ISSN/ISBN
2249-1929
Pages
9
Keywords
tin monosulphide, thin films, thermal evaporation, electrical conductivity, Hall Effect, film thickness.