عنوان المقالة:Distributed t-way test suite data generation using exhaustive search method with map and reduce framework Distributed t-way test suite data generation using exhaustive search method with map and reduce framework
Zainal Hisham Che Soh ; Syahrul Afzal Che Abdullah ; Kamal Zuhairi Zamli ; Mohammed I. Younis
English Authors
Zainal Hisham Che Soh ; Syahrul Afzal Che Abdullah ; Kamal Zuhairi Zamli ; Mohammed I. Younis
Abstract
In this paper, a new distributed algorithm for generating test suite for t-way testing utilizing a shared tuple space server as transport layer between master and worker is presented. The design of the algorithm is based on the Map and Reduce software framework implemented using tuple space technology. The proposed algorithm requires listing all the possible interaction elements into all partitioned space to ensure maximum interaction coverage in all partition. The exhaustive test cases is generated and loaded into their respective partition using hash based routing algorithm. The final test suite is produced from a reduced the test case obtained from the worker calculation on maximum interaction coverage. An encouraging simulation result is obtained on effectiveness of using the tuple space technology to parallelize the test suite generation on single machine and multi machine for different input parameter.
Abstract
In this paper, a new distributed algorithm for generating test suite for t-way testing utilizing a shared tuple space server as transport layer between master and worker is presented. The design of the algorithm is based on the Map and Reduce software framework implemented using tuple space technology. The proposed algorithm requires listing all the possible interaction elements into all partitioned space to ensure maximum interaction coverage in all partition. The exhaustive test cases is generated and loaded into their respective partition using hash based routing algorithm. The final test suite is produced from a reduced the test case obtained from the worker calculation on maximum interaction coverage. An encouraging simulation result is obtained on effectiveness of using the tuple space technology to parallelize the test suite generation on single machine and multi machine for different input parameter.
Publication Date
1/6/2011
Publisher
2010 IEEE Symposium on Industrial Electronics and Applications (ISIEA)
ا.د. محمد عصام يونس | Mohammed I. Younis | 12649