Despite being an important activity in the software development cycle (i.e. to ensure quality and reliability), exhaustive testing is prohibitively impossible. Systematic minimization strategy based on coverage or t-way parameter interactions are often sought for to help minimize the test space. Unlike coverage based minimization strategy which takes a white box approach, t-way parameter interactions based strategy (i.e. termed t-way testing) takes a black box approach in the sense that no information regarding the implementation is required to perform the reduction. Instead, t-way testing strategy solely relies on parameter interactions between input variables. Building from earlier work, this paper proposes a new strategy, called ITTW, to minimize the number of test set using the intersection of t-way tuples. In doing so, this paper also demonstrates the correctness of the ITTW strategy. Additionally, this paper also …
Abstract
Despite being an important activity in the software development cycle (i.e. to ensure quality and reliability), exhaustive testing is prohibitively impossible. Systematic minimization strategy based on coverage or t-way parameter interactions are often sought for to help minimize the test space. Unlike coverage based minimization strategy which takes a white box approach, t-way parameter interactions based strategy (i.e. termed t-way testing) takes a black box approach in the sense that no information regarding the implementation is required to perform the reduction. Instead, t-way testing strategy solely relies on parameter interactions between input variables. Building from earlier work, this paper proposes a new strategy, called ITTW, to minimize the number of test set using the intersection of t-way tuples. In doing so, this paper also demonstrates the correctness of the ITTW strategy. Additionally, this paper also …
Publication Date
9/18/2009
Publisher
2009 IEEE Symposium on Industrial Electronics & Applications
ا.د. محمد عصام يونس | Mohammed I. Younis | 13889