عنوان المقالة:A strategy for Grid based t-way test data generation A strategy for Grid based t-way test data generation
ا.د. محمد عصام يونس | Mohammed I. Younis | 14092
نوع النشر
مؤتمر علمي
المؤلفون بالعربي
Mohammed I. Younis ; Kamal Z. Zamli ; Nor Ashidi Mat Isa
المؤلفون بالإنجليزي
Mohammed I. Younis ; Kamal Z. Zamli ; Nor Ashidi Mat Isa
الملخص العربي
Although desirable as an important activity for ensuring quality assurances and enhancing reliability, complete and exhaustive software testing is next to impossible due to resources as well as timing constraints. While earlier work has indicated that pairwise testing (i.e. based on 2-way interaction of variables) can be effective to detect most faults in a typical software system, a counter argument suggests such conclusion cannot be generalized to all software system faults. In some system, faults may also be caused by more than two parameters. As the number of parameter interaction coverage (i.e. the strength) increases, the number of t-way test set also increases exponentially. As such, for large system with many parameters, considering higher order t-way test set can lead toward combinatorial explosion problem (i.e. too many data set to consider). We consider this problem for t-way generation of test set using the Grid strategy. Building and complementing from earlier work in In-Parameter-Order-General (or IPOG) and its modification (or MIPOG), we present the Grid MIPOG strategy (G_MIPOG). Experimental results demonstrate that G_MIPOG scales well against the sequential strategies IPOG and MIPOG with the increase of the computers as computational nodes.
الملخص الانجليزي
Although desirable as an important activity for ensuring quality assurances and enhancing reliability, complete and exhaustive software testing is next to impossible due to resources as well as timing constraints. While earlier work has indicated that pairwise testing (i.e. based on 2-way interaction of variables) can be effective to detect most faults in a typical software system, a counter argument suggests such conclusion cannot be generalized to all software system faults. In some system, faults may also be caused by more than two parameters. As the number of parameter interaction coverage (i.e. the strength) increases, the number of t-way test set also increases exponentially. As such, for large system with many parameters, considering higher order t-way test set can lead toward combinatorial explosion problem (i.e. too many data set to consider). We consider this problem for t-way generation of test set using the Grid strategy. Building and complementing from earlier work in In-Parameter-Order-General (or IPOG) and its modification (or MIPOG), we present the Grid MIPOG strategy (G_MIPOG). Experimental results demonstrate that G_MIPOG scales well against the sequential strategies IPOG and MIPOG with the increase of the computers as computational nodes.
تاريخ النشر
18/02/2009
الناشر
2008 First International Conference on Distributed Framework and Applications
رقم المجلد
رقم العدد
رابط DOI
10.1109/ICDFMA.2008.4784416
رابط الملف
تحميل (491 مرات التحميل)
الكلمات المفتاحية
T-way testing , grid computing , parallel processing , automation
رجوع